Presented by: Process-Electronic



Control of compound layer in the FNC process has traditionally been accomplished by fixed flow of process gasses. Inherent difficulty of measuring he process by extractive sampling, or the lack of in-situ sensor technology has eliminated the possibility of closed loop control, as well as documentation of the process that would aid in compliance to specifications such as CQI-9, and SAE AMS 2759/12. This presentation will explore a modern approach that will improve compound layer control as well as provide accurate process documentation.